TS268EU with NSN 6625-00-923-6534 of Voron Electronics Corp - Quick Quote

Thank you for your interest in our available TS268EU part on Unlimited NSN. Test Set Semiconduc is a part that is manufactured by Voron Electronics Corp, and it is listed with the part number TS268EU. This item, along with all of our inventory, is readily available for purchase today with competitive pricing. Our team members are on standby 24/7x365, and they can provide you with rapid lead-times on everything that you need to successfully carry out your operations.

Unlimited NSN is a state-of-the-art purchasing platform for NSN components like TS268EU and other obsolete parts, and we carry top requested NSN parts such as 6625009236534. To ensure that our customers only receive items with the utmost quality, we choose to stock our inventory from top global manufacturers such as Voron Electronics Corp.

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To find the components that you need, explore our available NSN part catalog under FSC 6625 Electrical and Electronic Properties Measuring and Testing Instruments, or utilize our user-friendly search engine and find specific items in a matter of seconds. If you are interested in TS268EU part number and are ready to begin the purchasing process, we invite you to fill out and submit an Instant RFQ today. Once received, a member of our staff will review and reach out to you in 15 minutes or less to provide a personalized quote based on your provided information. Experience the revolution of parts purchasing today with Unlimited NSN!


Characteristics Data of NSN 6625-00-923-6534, 6625009236534

MRCCriteriaCharacteristic
ABRYLength8.187 INCHES NOMINAL
MRCDecoded RequirementClear Text Reply
HGTHHeight3.625 INCHES NOMINAL
AQXZOperating Test CapabilityFRONT RESISTANCE-NOT GREATER THAN 0.5 KILOHM FOR A GOOD CRYSTAL; BACK RESISTANCE-RATIO OF BACK TO FRONT RESISTANCE GREATER THAN 10 TO 1 FOR A GOOD CRYSTAL; BACK CURRENT-CRYSTAL SHOULD NOT INDICATE CURRENT GREATER THAN - CRYSTAL IN21 AND IN23,IN23A,IN25,IN21A AND IN23B,IN21B,IN26 WE,IN26 SYL,IN78 SYL - CURRENT D. C. 0.400 MA,0.300 MA,0.250 MA,0.175 MA,0.125 MA,0.110 MA,0.230 MA,0.160 MA
ABGLWidth6.000 INCHES NOMINAL
AQXYTest Type For Which DesignedFRONT RESISTANCE OF CRYSTAL; BACK RESISTANCE OF CRYSTAL; BACK CURRENT OF CRYSTAL
ALSFInternal Battery AccommodationINCLUDED
ANPZInclosure FeatureSINGLE ITEM W/CARRYING CASE

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